FU Xinghua 1,2, FU Zhengyi 1, DING Biyan 2, SHAN Lianwer 2, WEI Qihong 2, HOU Wenping 2
(1.The State Key Laboratory of Material Composite and Advanced Technology,Wuhan University of Technology,430070; 2.Department of Materials Science and Engineering, Jinan University, 250022)
Abstract:The influences of ratios of Sr and Ba on the dielectric properties and microstructure of Sr1-xBaxTiO3; thin films were studied by means of impedance analyzer HPAgilent 4294A, SEM, XRD, and TEM. Maximum dielectric constant ε, minimum dielectric loss tanô appeared as ratio of Sr and Ba was 0.5 at the same test trequency. The temperature Tm for maximum ε(Curetemperature) was higher with the amount of Ba increased. Botter scattering frequency characteristics appeared for thin films in the scope of test frequency. Uniform distribution of tetragonal perovskit grains, no gas pocket and crack, lower stacking of crystal grains presented on the surface of thin film with the ratio of Sr and Ba by 0.5. The average grain diameter was about 80nm, spacing of lattice fringes was 0.296Å, orientation of crystal grains connecting to crystal boundary was disordered.
Keywords: ratio of Sr and Ba, SBT thin films, dielectric properties, characteristic microstructure, the temperature Tm for max-mum ε