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the Determination of Crystallinity According to Xrd Altas of Fine Silicon

YU Yan, RUAN  Yuzhong

（College of Materials Science and Engineering‚Fuzhou University‚350002）

Abstract：According to XRD patterns‚the crystallinity of superfine silicon dust at different temperature and different time were cal- culated．The crystallinity is defined as the ratio of diffraction intensity to scatter intensity．The multi－peaks seperation softwere was used to monitor the XRD patterns which was offered by Japan．This method is simple‚its results matched with the theoretic analysis.

Keywords：X－Ray‚crystallinity


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