LIANG Yanzhen 1,2，HUANG Jian 1,2
(1. Jingdezhen Ceramic Institute, Jingdezhen 333403, Jiangxi, China; 2. Foshan Huaxia Building Ceramic R & D Center, Foshan
528061, Guangdong, China)
Abstract: The calibration curves were fitted with standard materials such as ZrSiO4, SiO2, ZrO2, K-feldspar and their standard synthetic specimens. X-ray fluorescence spectroscopy (XRF) was established to accurately measure zircon-containing compounds such as zirconite and simultaneously determine the main and minor components of zirconium silicate samples such as SiO2, Al2O3, Fe2O3, TiO2, CaO, MgO, K2O,Na2O, P2O5, SO3, ZrO2 and HfO2. The sample was found to be uniformly mixed with 99.5% lithium tetraborate as a solvent at a melt dilution ratio of 1 : 10. When NH4Br was added as a release agent, it was pre-melted at 1050-1100 ℃ for 180 s, then melted for 900 s and stood still for 10 s. The measured melting sheet is basically the same as the certified value of the standard substance. The measurement error of each component is less than 0.5%, and the relative standard deviation (RSD, n = 5) is less than 10%.
Key words: X-ray fluorescence spectrometry; ZrSiO4; calibration curve